hrcak mascot   Srce   HID

Izvorni znanstveni članak
https://doi.org/10.2498/cit.1001982

Ensuring a High Quality Digital Device through Design for Testability

Christopher Umerah Ngene ; Department of Computer Engineering, University of Maiduguri, Nigeria

Puni tekst: engleski, PDF (988 KB) str. 235-246 preuzimanja: 520* citiraj
APA 6th Edition
Ngene, C.U. (2012). Ensuring a High Quality Digital Device through Design for Testability. Journal of computing and information technology, 20 (4), 235-246. https://doi.org/10.2498/cit.1001982
MLA 8th Edition
Ngene, Christopher Umerah. "Ensuring a High Quality Digital Device through Design for Testability." Journal of computing and information technology, vol. 20, br. 4, 2012, str. 235-246. https://doi.org/10.2498/cit.1001982. Citirano 27.02.2021.
Chicago 17th Edition
Ngene, Christopher Umerah. "Ensuring a High Quality Digital Device through Design for Testability." Journal of computing and information technology 20, br. 4 (2012): 235-246. https://doi.org/10.2498/cit.1001982
Harvard
Ngene, C.U. (2012). 'Ensuring a High Quality Digital Device through Design for Testability', Journal of computing and information technology, 20(4), str. 235-246. https://doi.org/10.2498/cit.1001982
Vancouver
Ngene CU. Ensuring a High Quality Digital Device through Design for Testability. Journal of computing and information technology [Internet]. 2012 [pristupljeno 27.02.2021.];20(4):235-246. https://doi.org/10.2498/cit.1001982
IEEE
C.U. Ngene, "Ensuring a High Quality Digital Device through Design for Testability", Journal of computing and information technology, vol.20, br. 4, str. 235-246, 2012. [Online]. https://doi.org/10.2498/cit.1001982

Sažetak
An electronic device is reliable if it is available for use most of the times throughout its life. The reliability can be affected by mishandling and use under abnormal operating conditions. High quality product cannot be achieved without proper verification and testing during the product development cycle. If the design is difficult to test, then it is very likely that most of the faults will not be detected before it is shipped to the customer. This paper describes how product quality can be improved by making the hardware design testable. Various designs for testability techniqueswere discussed. A three bit counter circuit was used to illustrate the benefits of design for testability by using scan chain methodology.

Ključne riječi
design for testability; digital devices; faults; defect level; reliability; testing

Hrčak ID: 99476

URI
https://hrcak.srce.hr/99476

Posjeta: 703 *