Izvorni znanstveni članak
Characterization of TiO2 Nanofilms Obtained by Sol-gel and Anodic Oxidation
María Laura Vera
; Instituto de Materiales de Misiones (IMAM), CONICET - Universidad Nacional de Misiones, Misiones, Argentina
Miguel Ángel Alterach
; Instituto de Materiales de Misiones (IMAM), CONICET - Universidad Nacional de Misiones, Misiones, Argentina
Mario Roberto Rosenberger
; Instituto de Materiales de Misiones (IMAM), CONICET - Universidad Nacional de Misiones, Misiones, Argentina
Diego Germán Lamas
; Centro de Investigaciones de Sólidos (CINSO), CITEDEF - CONICET, Buenos Aires, Argentina
Carlos Enrique Schvezov
; Instituto de Materiales de Misiones (IMAM), CONICET - Universidad Nacional de Misiones, Misiones, Argentina
Alicia Esther Ares
orcid.org/0000-0001-5384-8476
; Instituto de Materiales de Misiones (IMAM), CONICET - Universidad Nacional de Misiones, Misiones, Argentina
Sažetak
The influence of sol-gel dip-coating and anodic oxidation process parameters in producing thin TiO2 films is studied. As the size of the films is in the order of nanometres (20-140 nm), to obtain a precise measurement of their thickness and analyse their crystalline structures, glancing incidence angle X-ray techniques (X-ray reflectometry and X-ray diffraction) using synchrotron radiation are used. A relationship between the colour and thickness of the films was found. This enables the film thickness to be estimated by the film colour. Within the range of the parameters studied, both techniques produce thin films with smooth surfaces which at most reproduce the roughness of the polished substrate. Independently of the technique, thermally-treated films thicker than 30 nm presented different crystalline structures with anatase and rutile phases.
Ključne riječi
titanium oxide films; sol-gel dip-coating; anodic oxidation; X-ray reflectometry; X-ray diffraction
Hrčak ID:
142601
URI
Datum izdavanja:
1.1.2014.
Posjeta: 1.274 *