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Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints

Davor Balzar ; X-ray Laboratory, Division of Materials Science and Electronics, Department of Physics, Ruđer Bošković Institute, P.O. Box 1016, 10001 Zagreb, Croatia

Puni tekst: engleski, pdf (21 MB) str. 1069-1115 preuzimanja: 155* citiraj
APA 6th Edition
Balzar, D. (1996). Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints. Croatica Chemica Acta, 69 (3), 1069-1115. Preuzeto s https://hrcak.srce.hr/177133
MLA 8th Edition
Balzar, Davor. "Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints." Croatica Chemica Acta, vol. 69, br. 3, 1996, str. 1069-1115. https://hrcak.srce.hr/177133. Citirano 29.07.2021.
Chicago 17th Edition
Balzar, Davor. "Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints." Croatica Chemica Acta 69, br. 3 (1996): 1069-1115. https://hrcak.srce.hr/177133
Harvard
Balzar, D. (1996). 'Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints', Croatica Chemica Acta, 69(3), str. 1069-1115. Preuzeto s: https://hrcak.srce.hr/177133 (Datum pristupa: 29.07.2021.)
Vancouver
Balzar D. Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints. Croatica Chemica Acta [Internet]. 1996 [pristupljeno 29.07.2021.];69(3):1069-1115. Dostupno na: https://hrcak.srce.hr/177133
IEEE
D. Balzar, "Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints", Croatica Chemica Acta, vol.69, br. 3, str. 1069-1115, 1996. [Online]. Dostupno na: https://hrcak.srce.hr/177133. [Citirano: 29.07.2021.]

Sažetak
Diffraction lines are broadened for two reasons: instrumental configuration and physical origins. The latter yields information on
materials microstructure. The complete process of line-broadening
analysis is discussed, beginning with experimental procedure s and
a correction for instrumental broadening. In the analysis of the
physically broadened line profile, the main emphasis is given to the
widely used methods of separation of size and strain broadening:
the Warren-Averbach approximation and integral-breadth methods.
The integral-breadth methods are collated and their reliability
discussed. Close attention is given to an assumed Vcigt-function
profile shape for both size-broadened and strain-broadened profiles
because it is shown that a Voigt function fits satisfactorily the
physically broadened line profiles of W and MgO obtained by the
Stokes-deconvolution method. The subsequent analyses of broadening are performed by using the Warren-Averbach and »double- Voigt« approaches and results are compared.

Hrčak ID: 177133

URI
https://hrcak.srce.hr/177133

Posjeta: 295 *