Generalized tolerance sensitivity and DEA metric sensitivity

Authors

  • Luka Neralić
  • Richard E Wendell

Abstract

This paper considers the relationship between Tolerance sensitivity analysis in optimization and metric sensitivity analysis in Data Envelopment Analysis (DEA). Herein, we extend the results on the generalized Tolerance framework proposed by Wendell and Chen and show how this framework includes DEA metric sensitivity as a special case. Further, we note how recent results in Tolerance sensitivity suggest some possible extensions of the results in DEA metric sensitivity.

Author Biography

Richard E Wendell

Professor of Business Administration

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Published

2015-04-29

Issue

Section

CRORR Journal Regular Issue