Original scientific paper
Current filamentation and degradation in electronic devices based on amorphous organic layers
Eduard Tutiš
; Institute of Physics, Bijenička cesta 46, P.O. Box 304, HR-10 000 Zagreb, Croatia
Ivo Batistić
; Department of Physics, University of Zagreb, Bijenička cesta 32, P.O. Box 331 HR-10 002 Zagreb, Croatia
Abstract
The recent advent of new flat-panel organic displays follows a long struggle for the extended device lifetime. Many modifications proposed along this way have been based on trial and error experimentation. In this paper, we show that some recent major improvements may have been implicitly related to fighting against the strong current filamentation, intrinsic for charge injection and conduction in organic amorphous thin films. We first recapitulate some major causes of current filamentation in thin amorphous organic layers. Then we consider the charge transport in devices with a high-mobility injection layer, with a smoothened organic heterojunction surface, that operate at lower electric fields, and the devices with doped transport layers. We show that these conditions, known to decrease the device degradation rates, may separately lead to the current homogenization in organic films.
Keywords
organic-molecular devices; light-emitting diodes; filamentation; numerical simulations; degradation; ageing
Hrčak ID:
301998
URI
Publication date:
1.5.2005.
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