Izvorni znanstveni članak
Field ion microscope studies of 400 eV argon ion bombardment damage in tungsten
B. Gregov
; Department of Electrical Engineering, The University of Alberta, Alberta, Canada
R. P. W. Lawson
; Department of Electrical Engineering, The University of Alberta, Alberta, Canada
Sažetak
Field ion microscope has been used to investigate argon ion bombardment of tungsten at 63 K. The bombardment was carried out at a background pressure in the 10^-11 torr range with 400 eV Ar^+ ions. Clusters of vacancies and interstitials have been observed. After field evaporation of a few atomic layers damage could still be observed on the newly exp0sed surface indicating damage produced inside the specimen. Evidence for an assisted focusing event in the direction of the [100] - zone is presented.
Ključne riječi
Hrčak ID:
321990
URI
Datum izdavanja:
3.12.1973.
Posjeta: 91 *