APA 6th Edition

Urli, N. (1976). Characterization of defects in semiconductors by capacitance methods. Fizika, 8, supplement, 68-70. Preuzeto s https://hrcak.srce.hr/index.php/338177

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MLA 8th Edition

Urli, N.. "Characterization of defects in semiconductors by capacitance methods." Fizika, vol. 8, supplement, 1976, str. 68-70. https://hrcak.srce.hr/index.php/338177. Citirano 23.07.2026.

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Chicago 17th Edition

Urli, N.. "Characterization of defects in semiconductors by capacitance methods." Fizika 8, supplement (1976): 68-70. https://hrcak.srce.hr/index.php/338177

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Harvard

Urli, N. (1976). 'Characterization of defects in semiconductors by capacitance methods', Fizika, 8, supplement, str. 68-70. Preuzeto s: https://hrcak.srce.hr/index.php/338177 (Datum pristupa: 23.07.2026.)

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Vancouver

Urli N. Characterization of defects in semiconductors by capacitance methods. Fizika [Internet]. 1976 [pristupljeno 23.07.2026.];8, supplement:68-70. Dostupno na: https://hrcak.srce.hr/index.php/338177

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IEEE

N. Urli, "Characterization of defects in semiconductors by capacitance methods", Fizika, vol.8, supplement, str. 68-70, 1976. [Online]. Dostupno na: https://hrcak.srce.hr/index.php/338177. [Citirano: 23.07.2026.]