Original scientific paper
https://doi.org/10.1080/00051144.2021.1969148
Reliability of vertical-cavity surface-emitting laser arrays with redundancy
Dubravko Babić
; Applied Optics Laboratory, Faculty of electrical engineering and computing, University of Zagreb, Zagreb, Croatia
Abstract
This paper describes theoretical reliability analysis of a system containing n optical ports in which each optical port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integration approaches: (A) each laser on its own chip, resulting in m·n chips, (B) m redundant lasers associated with one channel are on a single chip, resulting in n chips, and (C) all m·n lasers integrated on a single chip. We present a model that includes the run-to-run reliability parameter fluctuation and find that the three integration schemes consistently exhibit MTTF(C) ≥ MTTF(A) ≥ MTTF(B) for lognormal distribution shape parameters observed in commercial vertical-cavity surface-emitting lasers. We also provide analytic approximations for the failure statistics for all three integration approaches enabling straightforward calculation of the failure statistics for any redundancy and channel number.
Keywords
Vertical-cavity surface-emitting laser arrays; integration; reliability; redundancy; failure statistics
Hrčak ID:
269850
URI
Publication date:
20.10.2021.
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