Izvorni znanstveni članak

https://doi.org/10.5562/cca2234

Composition and Morphology Investigation of NiCoB Nanoparticles, as-Prepared and Coated by SiO2

Ivana Lončarek ; Department of Physics, Faculty of Science, University of Zagreb, Bijenička cesta 32, HR-10000 Zagreb, Croatia
Anđelka M. Tonejc ; Department of Physics, Faculty of Science, University of Zagreb, Bijenička cesta 32, HR-10000 Zagreb, Croatia
Željko Skoko orcid.org/0000-0003-3000-7353 ; Department of Physics, Faculty of Science, University of Zagreb, Bijenička cesta 32, HR-10000 Zagreb, Croatia
Nikolina Novosel ; Department of Physics, Faculty of Science, University of Zagreb, Bijenička cesta 32, HR-10000 Zagreb, Croatia
Mislav Mustapić ; Department of Physics, Faculty of Science, University of Zagreb, Bijenička cesta 32, HR-10000 Zagreb, Croatia
Krešo Zadro ; Department of Physics, Faculty of Science, University of Zagreb, Bijenička cesta 32, HR-10000 Zagreb, Croatia

Sažetak

NiCoB nanoparticles, as-prepared and coated by SiO2, were synthesized by chemical reduction of metallic salts. The as-prepared samples were additionally annealed at 650 for 1 hour in argon atmos-phere. All samples (the as-prepared and annealed ones) were investigated by X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive spectroscopy (EDS). According to FE-SEM observations each of the investigated samples was composed of nearly spherical nanoparticles with average dimension smaller than 30 nm. Also, tendency of formation of irregular agglomerates was present in both cases of the as-prepared and annealed investigated samples. XRD measurements of as-prepared samples revealed fully amorphous structure. In case of annealed samples, crystallization of different phases was confirmed (as a consequence of heat treatment at 650 C). The existence of these phases was also observed from FE-SEM micrographs as different morphologies present in the samples.(doi: 10.5562/cca2234)

Ključne riječi

amorphous NiCoB nanoparticles; X-ray diffraction; Rietveld refinement; scanning electron microscopy (SEM); energy dispersive X-ray analysis (EDS)

Hrčak ID:

111326

URI

https://hrcak.srce.hr/111326

Datum izdavanja:

20.11.2013.

Posjeta: 2.364 *