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Determination of optical constants of thermally evaporated CdSxSe1-x thin films using only transmission spectra

Laila. I. Soliman ; Solid State Physics Laboratory, National Research Centre, Cairo, Egypt
Alaa M. Ibrahim ; University College for Girls, Ain Shams University, Physics Department, Cairo, Egypt


Puni tekst: engleski pdf 78 Kb

str. 181-188

preuzimanja: 41

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Sažetak

A procedure to calculate the optical constants and thickness of thin films, using only data from the transmission spectra, has been employed in the case of cadmium sulfo-selenide films prepared by thermal evaporation. Using this technique, the calculated thickness was found to an accuracy ranging between 1.0 and 3.0% compared with other methods. The refractive index and the absorption coefficient, as a function of composition (i.e. value of x) have been derived using this technique that proved to be very accurate. CdSxSe1-x films have a direct energy gap for films of various composition, and the values of the energy gap were found to increase when increasing the content of sulphur (x).

Ključne riječi

Hrčak ID:

299936

URI

https://hrcak.srce.hr/299936

Datum izdavanja:

1.10.1997.

Podaci na drugim jezicima: hrvatski

Posjeta: 206 *