Original scientific paper
On use of pseudo-Voigt profiles in diffraction line broadening analysis
Prabal Dasgupta
; Department of C.S.S., Indian Association for the Cultivation of Science, Jadavpur, Calcutta 700 032
Abstract
Sample-related X-ray diffraction profiles are often fitted with a pseudo-Voigt function, which is a linear combination of a Cauchy and a Gaussian function, particularly for the cases of size-strain analysis. This work reveals that Cauchy content, h, must be greater than 0.328 in case of pseudo-Voigt profile, otherwise one can not expect any meaningful accuracy in terms of data on crystallite size extracted from such profiles. h values published by several authors, who have made use of pseudo-Voigt function as profile fitting function, were thoroughly studied and it was found that their reported h values agree with the present theory.
Keywords
X-ray diffraction profiles; pseudo-Voigt function
Hrčak ID:
301059
URI
Publication date:
1.6.2000.
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