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Structural investigation and electrical properties of thin indium films+

B. Dragović ; Institute of Physics, P. 0. Box 51, 11001 Beograd, Yugoslavia
B. Sazdović ; Institute of Physics, P. 0. Box 51, 11001 Beograd, Yugoslavia

Sažetak

Thin indium films of thickness ranged from 15 to 100 nm were deposited onto glass substrates with a deposition rate of 0.31 nm/s by thermal evaporation technique. The grain size increased with increasing film thickness. The resistivity decreased with increasing film thickness. The resistivity-thickness relation does not fit the theories of either Fuchs-Sondheimer or Mayadas-Shatzkes. The values of mean free path l0 of the charge carriers were calculated.

Ključne riječi

Hrčak ID:

328260

URI

https://hrcak.srce.hr/328260

Datum izdavanja:

1.9.1982.

Podaci na drugim jezicima: hrvatski

Posjeta: 401 *