APA 6th Edition

Urli, N. (1976). Characterization of defects in semiconductors by capacitance methods. Fizika, 8, supplement, 68-70. Retrieved from https://hrcak.srce.hr/338177

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MLA 8th Edition

Urli, N.. "Characterization of defects in semiconductors by capacitance methods." Fizika, vol. 8, supplement, 1976, pp. 68-70. https://hrcak.srce.hr/338177. Accessed 18 Aug. 2026.

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Chicago 17th Edition

Urli, N.. "Characterization of defects in semiconductors by capacitance methods." Fizika 8, supplement (1976): 68-70. https://hrcak.srce.hr/338177

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Harvard

Urli, N. (1976). 'Characterization of defects in semiconductors by capacitance methods', Fizika, 8, supplement, pp. 68-70. Available at: https://hrcak.srce.hr/338177 (Accessed 18 August 2026)

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Vancouver

Urli N. Characterization of defects in semiconductors by capacitance methods. Fizika [Internet]. 1976 [cited 2026 August 18];8, supplement:68-70. Available from: https://hrcak.srce.hr/338177

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IEEE

N. Urli, "Characterization of defects in semiconductors by capacitance methods", Fizika, vol.8, supplement, pp. 68-70, 1976. [Online]. Available: https://hrcak.srce.hr/338177. [Accessed: 18 August 2026]