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Original scientific paper

https://doi.org/10.7305/automatika.2014.12.605

Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis

Lan Ma ; School of Automation Engineering, University of Electronic Science and Technology of China, No.2006, West Hi-Tech Zone, Chengdu, Sichuan, China
Dongjie Bi ; School of Automation Engineering, University of Electronic Science and Technology of China, No.2006, West Hi-Tech Zone, Chengdu, Sichuan, China
Houjun Wang ; School of Automation Engineering, University of Electronic Science and Technology of China, No.2006, West Hi-Tech Zone, Chengdu, Sichuan, China


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Abstract

A new method for detection of parametric faults occurring in analog circuits based on relative amplitude and relative phase analysis of the Circuit Under Test (CUT) is proposed. The relative amplitude is the common power change of the signals and the relative phase presents the relative phase offset of the signals. In the proposed method, the value of each component of the CUT is varied within its tolerance limit using Monte Carlo simulation. The upper and lower bounds of relative amplitude and phase of the CUT sampling series are obtained. While testing, the relative amplitude and phase value of the analog circuit are obtained. If any one of the relative amplitude and phase values exceed the bounds then the CUT is declared faulty. The effectiveness of the proposed method is validated through HSpice/MATLAB simulations of two benchmark circuits and the practical circuit test of Tow-Thomas circuit.

Keywords

Relative amplitude, Relative phase, Parametric fault, Analog circuit, Fault detection

Hrčak ID:

133171

URI

https://hrcak.srce.hr/133171

Article data in other languages: croatian

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