Original scientific paper
Structural investigation and electrical properties of thin indium films+
B. Dragović
; Institute of Physics, P. 0. Box 51, 11001 Beograd, Yugoslavia
B. Sazdović
; Institute of Physics, P. 0. Box 51, 11001 Beograd, Yugoslavia
Abstract
Thin indium films of thickness ranged from 15 to 100 nm were deposited onto glass substrates with a deposition rate of 0.31 nm/s by thermal evaporation technique. The grain size increased with increasing film thickness. The resistivity decreased with increasing film thickness. The resistivity-thickness relation does not fit the theories of either Fuchs-Sondheimer or Mayadas-Shatzkes. The values of mean free path l0 of the charge carriers were calculated.
Keywords
Hrčak ID:
328260
URI
Publication date:
1.9.1982.
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