Original scientific paper

Diffraction Line Broadening - Nuisance or Lattice- Imperfections Fingerprints

Davor Balzar ; X-ray Laboratory, Division of Materials Science and Electronics, Department of Physics, Ruđer Bošković Institute, P.O. Box 1016, 10001 Zagreb, Croatia

Abstract

Diffraction lines are broadened for two reasons: instrumental configuration and physical origins. The latter yields information on
materials microstructure. The complete process of line-broadening
analysis is discussed, beginning with experimental procedure s and
a correction for instrumental broadening. In the analysis of the
physically broadened line profile, the main emphasis is given to the
widely used methods of separation of size and strain broadening:
the Warren-Averbach approximation and integral-breadth methods.
The integral-breadth methods are collated and their reliability
discussed. Close attention is given to an assumed Vcigt-function
profile shape for both size-broadened and strain-broadened profiles
because it is shown that a Voigt function fits satisfactorily the
physically broadened line profiles of W and MgO obtained by the
Stokes-deconvolution method. The subsequent analyses of broadening are performed by using the Warren-Averbach and »double- Voigt« approaches and results are compared.

Keywords

Hrčak ID:

177133

URI

https://hrcak.srce.hr/177133

Publication date:

1.11.1996.

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