Izvorni znanstveni članak

Structure and electrical properties of thin zinc films+

Elhamy A. Abou-Saif ; Electron Microscope and Thin Films Laboratory, Physics Department, National Research Centre, Dokki, Cairo, Egypt
Mohamed M. El-Oker ; Physics Department, Faculty of Science, Al-Azhar University, Cairo, Egypt
Hesham M. T. Aly ; Physics Department, Faculty of Science, Al-Azhar University, Cairo, Egypt
Abdel-Aziz A. Mohamed ; Physics Department, Faculty of Science, Ain Shams University, Cairo, Egypt

Sažetak

Thin zinc films of thicknesses ranging from 15 to 75 nm were deposited with rate 0.25 nm/s onto amorphous glass substrates using thermal evaporation method. Nucleation, growth and structure of the films were investigated by transmission electron microscopy diffraction techniques. The films were of polycrystalline structure. The grain size and density were varied with film thickness. The values of bulk resistivity, mean free path and temperature coefficient of resistance of the films were calculated and correlated with film structure. Other physical data were estimated from the theoretical formula.

Ključne riječi

Hrčak ID:

328929

URI

https://hrcak.srce.hr/328929

Datum izdavanja:

5.12.1983.

Podaci na drugim jezicima: hrvatski

Posjeta: 383 *