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Original scientific paper
https://doi.org/10.7305/automatika.2014.12.605

Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis

Lan Ma ; School of Automation Engineering, University of Electronic Science and Technology of China, No.2006, West Hi-Tech Zone, Chengdu, Sichuan, China
Dongjie Bi ; School of Automation Engineering, University of Electronic Science and Technology of China, No.2006, West Hi-Tech Zone, Chengdu, Sichuan, China
Houjun Wang ; School of Automation Engineering, University of Electronic Science and Technology of China, No.2006, West Hi-Tech Zone, Chengdu, Sichuan, China

Fulltext: english, pdf (3 MB) pages 343-350 downloads: 498* cite
APA 6th Edition
Ma, L., Bi, D. & Wang, H. (2014). Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis. Automatika, 55 (3), 343-350. https://doi.org/10.7305/automatika.2014.12.605
MLA 8th Edition
Ma, Lan, et al. "Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis." Automatika, vol. 55, no. 3, 2014, pp. 343-350. https://doi.org/10.7305/automatika.2014.12.605. Accessed 28 Nov. 2021.
Chicago 17th Edition
Ma, Lan, Dongjie Bi and Houjun Wang. "Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis." Automatika 55, no. 3 (2014): 343-350. https://doi.org/10.7305/automatika.2014.12.605
Harvard
Ma, L., Bi, D., and Wang, H. (2014). 'Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis', Automatika, 55(3), pp. 343-350. https://doi.org/10.7305/automatika.2014.12.605
Vancouver
Ma L, Bi D, Wang H. Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis. Automatika [Internet]. 2014 [cited 2021 November 28];55(3):343-350. https://doi.org/10.7305/automatika.2014.12.605
IEEE
L. Ma, D. Bi and H. Wang, "Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis", Automatika, vol.55, no. 3, pp. 343-350, 2014. [Online]. https://doi.org/10.7305/automatika.2014.12.605

Abstracts
A new method for detection of parametric faults occurring in analog circuits based on relative amplitude and relative phase analysis of the Circuit Under Test (CUT) is proposed. The relative amplitude is the common power change of the signals and the relative phase presents the relative phase offset of the signals. In the proposed method, the value of each component of the CUT is varied within its tolerance limit using Monte Carlo simulation. The upper and lower bounds of relative amplitude and phase of the CUT sampling series are obtained. While testing, the relative amplitude and phase value of the analog circuit are obtained. If any one of the relative amplitude and phase values exceed the bounds then the CUT is declared faulty. The effectiveness of the proposed method is validated through HSpice/MATLAB simulations of two benchmark circuits and the practical circuit test of Tow-Thomas circuit.

Keywords
Relative amplitude; Relative phase; Parametric fault; Analog circuit; Fault detection

Hrčak ID: 133171

URI
https://hrcak.srce.hr/133171

[croatian]

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