APA 6th Edition Fuess, H. (1996). Contributions of Crystallography to Materials Science. Croatica Chemica Acta, 69 (3), 1053-1067. Retrieved from https://hrcak.srce.hr/177132
MLA 8th Edition Fuess, Hartmut. "Contributions of Crystallography to Materials Science." Croatica Chemica Acta, vol. 69, no. 3, 1996, pp. 1053-1067. https://hrcak.srce.hr/177132. Accessed 25 Jul. 2021.
Chicago 17th Edition Fuess, Hartmut. "Contributions of Crystallography to Materials Science." Croatica Chemica Acta 69, no. 3 (1996): 1053-1067. https://hrcak.srce.hr/177132
Harvard Fuess, H. (1996). 'Contributions of Crystallography to Materials Science', Croatica Chemica Acta, 69(3), pp. 1053-1067. Available at: https://hrcak.srce.hr/177132 (Accessed 25 July 2021)
Vancouver Fuess H. Contributions of Crystallography to Materials Science. Croatica Chemica Acta [Internet]. 1996 [cited 2021 July 25];69(3):1053-1067. Available from: https://hrcak.srce.hr/177132
IEEE H. Fuess, "Contributions of Crystallography to Materials Science", Croatica Chemica Acta, vol.69, no. 3, pp. 1053-1067, 1996. [Online]. Available: https://hrcak.srce.hr/177132. [Accessed: 25 July 2021]
Abstracts The properties o fmaterials used in various domains of science and engineering are directly correlated to the microstructure. Crystallography is devoted to the investigaton of microstructure of substances and materials by a variety of diffraction and spectroscopic methods. Several examples related to research in the department of materials science at the Technical University of Darmstadt are presented. The structure and dynamics of aromatic host molecules in catalytically active zeolites are investigated by X-ray and neutron diffraction and NMR-spectroscopy combined with inelastic neutron scattering. Surfaces and interfaces of semiconductors and thin superconducting films are studied by grazing incidence techniques. By examination of the reflectogram details on thickness, composition, surface roughness and a possible modification of these values are obtained. Transmission electron microscopy provides complementary information on the structure of interfaces, especially through the support of simulated images by a multi-slice method. Work is presented on CoSi2-filmson Si and wafers of GaAs with LaB6 films. Modification of the seewafers by ion mixing techniques is attempted. Furthermore, surface hardening of steel by ion implantation (carbon and nitrogen) is away of improving tribological properties. Grazing incidence provides results on the formation of different carbides as a function of depth. Superconducting films of Bi2Sr2CaCu20s on SrTi03 showed an improvement by a factor of 10 in critical current density by creating holes (Xe,Au, U'-irradiation) as pinning centres. The examination by TEM revealed an amorphization of the channel s with dear boundaries between the channel and nonirradiated material.