Original scientific paper

Electrical conductivity and the structure of thin bismuth films

A. H. Abou El Ela ; Physics Department, Islamic Girls College, Nasr City Cairo, and Physics Department, National Research Centre, Cairo, Egypt
S. Mahmoud ; Physics Department, Islamic Girls College, Nasr City Cairo, and Physics Department, National Research Centre, Cairo, Egypt
M. A. Mahmoud ; Physics Department, Islamic Girls College, Nasr City Cairo, and Physics Department, National Research Centre, Cairo, Egypt
A. H. Eid ; Physics Department, Islamic Girls College, Nasr City Cairo, and Physics Department, National Research Centre, Cairo, Egypt

Abstract

Measurements of the electrical conductivity and the observations of the accompanying changes of structural properties of bismuth films of different thicknesses were carried out at room temperature. The electrical conduction mechanism was correlated with structural changes occuring during growth of the film. For small thickness d < L, where L is the electron mean free path, the film resistance varied as d-n, where n ≈ 2. However, for d > L the value of n become smaller than 2.

Keywords

Hrčak ID:

327748

URI

https://hrcak.srce.hr/327748

Publication date:

2.11.1981.

Article data in other languages: croatian

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