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Failure prediction of ultra capacitor stack using fuzzy inference system

Jingzhi Li ; College of Information Engineering, Capital Normal University, Beijing
Guohui Wang ; School of Mathematical Sciences, Capital Normal University, Beijing
Lifeng Wu ; College of Information Engineering, Capital Normal University, Beijing
Xiaojuan Li ; College of Information Engineering, Capital Normal University, Beijing


Puni tekst: engleski PDF 1.131 Kb

str. 103-111

preuzimanja: 373

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Sažetak

The failure of the ultracapacitor was significantly accelerated by elevated temperature or increased voltage. Because of the capacitance difference between the capacitor cells, after a number of deep charging/discharging cycles, the voltage difference between cells will be enlarged. This will accelerate the aging of the weak ultracapacitors and affect the output power. So, to improve stack reliability, a correct and timely failure prediction is essential. Based on diverse faults, a fuzzy rule-based inference system, which could approximate human reasoning, was considered. With this method we can reduce uncertainty, inconvenience and inefficiency resulting from the inherent factors. The simulate results under industrial application conditions are given to verify the method.

Ključne riječi

ultracapacitor stack, failure modes, failure prediction, fuzzy inference

Hrčak ID:

139388

URI

https://hrcak.srce.hr/139388

Posjeta: 558 *