Izvorni znanstveni članak

Synchrotron X-ray diffraction line profile

Davor Balzar ; Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303, U. S. A.; On leave from X-ray Laboratory, Division of Materials Research and Electronics, Physics Department, Ruđer Bošković Institute, P.O. Box 1016, 10001 Zagreb, Croatia
Peter W. Stephens ; National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, U. S. A.; On leave from Physics Department, State University of New York, Stony Brook, NY 11794, U. S. A.
Hassel Ledbetter ; Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303, U. S. A.

Sažetak

We analyse diffraction line profiles obtained at the X3B1 National Synchrotron Light Source powder-diffraction beamline. Calculated diffraction-line widths are compared to the measurements of a National Institute of Science and Technology Standard Reference Material, LaB6. The discrepancy at high Bragg angles is probably caused by the inadequate Gaussian approximation for the Darwin width of monochromator Bragg reflection. The equatorial-slit width has a major influence not only on vertical (equatorial) divergence but also on the character of diffraction-line profiles at high angles. The least-squares fits of instrument-function deconvoluted tungsten-line profiles show that a Voigt function satisfactorily models physically broadened line profiles.

Ključne riječi

Hrčak ID:

299840

URI

https://hrcak.srce.hr/299840

Datum izdavanja:

1.3.1997.

Podaci na drugim jezicima: hrvatski

Posjeta: 180 *