Pismo uredniku
A new approach for refractive index measurement of the double layer poly-silicon films
Ioanna Demakopoulou
; Department of Physics, Faculty of Natural Sciences, University of Prishtina, Yugoslavia
Jahja Kokaj
; Department of Physics, Faculty of Natural Sciences, University of Prishtina, Yugoslavia
Sažetak
Interferometry approach for the index refraction measurement of the poly-Si films is proposed. Only spectral values ωRmin, ωRmax which are related to reflected values Rmin, Rmax are measured. Beside pure scientific investigations this approach can be used for routine control of the poly-Si films.
Ključne riječi
Hrčak ID:
332039
URI
Datum izdavanja:
10.9.1991.
Posjeta: 320 *