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Fizika : a journal of experimental and theoretical physics, Vol. 22, supplement 1 , 1990.

Meeting abstract

Diffraction X-ray spectrometer

J. Čiček ; Ruđer Bošković Institute, Zagreb
D. Cika ; Ruđer Bošković Institute, Zagreb
V. Valković ; Ruđer Bošković Institute, Zagreb

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page 115-125

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Abstract

High energy resolution X-ray spectrometer to be used in the study of charged particle induced X-ray emission is described. The spectrometer will be used for the analysis of the essential trace elements and their compounds in biological material as well as for the study of multiple inner-shell ionization processes induced by heavy ions. The disadvantage of this detector is a small energy range for one configuration of the crystal or one position of the PSPC. The X-ray energy region is easily changed by selecting different crystal types and their Bragg angle. In this work the

Keywords

Hrčak ID:

338443

URI

https://hrcak.srce.hr/338443

Publication date:

19.12.1990.

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