Meeting abstract
Comparative analysis of far infrared transmission and reflectivity spectra in layer crystals
P. M. Nikolić
; Faculty of Electrical Engineering and Institute of Physics, Belgrade University
P. Mihajlović
; Philosophy Faculty, Niš University and Institute of Physics, Belgrade University
Abstract
Far infrared transmission and reflectivity spectra are compared for phonon frequency measurements in multimode layer crystals. For a typical layered semiconductor (single crystal GeS) these measurements have been done using polarized light. Four oscillators were observed for E//a and E//b, using either reflectivity or transmission data. The necessary conditions for obtaining transmission data free of spurious interference effects were determined.
Keywords
Hrčak ID:
340718
URI
Publication date:
15.12.1980.
Visits: 154 *