Original scientific paper
Preparation and characterization of C60/C70+Ni polycrystalline thin film grown on different substrates
Elzhieta Czerwosz
; Institute of Vacuum Technology, 00-241 Warsaw, Dluga 44/50, Poland
Przemystaw Byszewski
; Institute of Vacuum Technology, 00-241 Warsaw, Dluga 44/50, Poland; Institute of Physics, Polish Academy of Sciences, 02-628 Warsaw, al. Lotnikow 32/46, Poland
Piotr Dluzewski
; Institute of Physics, Polish Academy of Sciences, 02-628 Warsaw, al. Lotnikow 32/46, Poland
Halina Wronka
; Institute of Vacuum Technology, 00-241 Warsaw, Dluga 44/50, Poland
Ryszard Diduszko
; Institute of Vacuum Technology, 00-241 Warsaw, Dluga 44/50, Poland
Joanna Radomska
; Institute of Vacuum Technology, 00-241 Warsaw, Dluga 44/50, Poland
Mirostaw Kozlowski
; Institute of Vacuum Technology, 00-241 Warsaw, Dluga 44/50, Poland
Abstract
C60/C70 + Ni films were obtained by thermal evaporation method in a wide range of Ni concentration (from 1.5 to 10 wt. %). The polycrystalline structure was detected in layers with Ni concentration of 1.5 wt. %. For this Ni concentration, growth of grains in columnar form was observed by SEM. TEM examination showed existence of crystalline grains of a size of a few micrometers and 10 - 200 nm thick. The electron and X-ray diffraction exhibited Bragg distances of approx. 0.87, 0.83, 0.50 and 0.32 nm, and in electron diffraction 1.0, 0.76 and 0.65 nm interplanar distances were found. In Raman spectra, typical fullerenes and two other bands placed at 580 and 1100 cm-1 were observed. The intensity of the latter bands depends on Ni concentration. For Ni concentration higher then 1.5 wt. %, the degradation of fullerene structure was observed by HRTEM, electron and X-ray diffraction.
Keywords
Hrčak ID:
299477
URI
Publication date:
2.5.1995.
Visits: 148 *