Original scientific paper

A new method for determination of stacking fault energy of pure metals by X-ray diffraction

Partha Chatterjee ; Department of Physics & Electronics, Vivekananda Mahavidyalaya, Haripal, Hooghly 712 405, West Bengal, India
Some Nath Dey ; Department of Physics, Haldia Govt. College, Haldia, Midnapore East-721657, West Bengal, India

Abstract

An indirect method for the determination of stacking fault energies (SFE) of pure metals by X-ray diffraction technique is reported. The existing methods for the calculation of SFE suffer from simplified assumptions regarding dislocation distribution and type of dislocation present in the specimen. The present method is based on the strain field model of dislocations assuming a restrictedly random dislocation distribution. The method is applied for the calculation of SFE of plastically deformed copper and the values come out to be very close to those obtained from direct observation methods like TEM.

Keywords

X-ray diffraction; stacking faults; dislocations

Hrčak ID:

302745

URI

https://hrcak.srce.hr/302745

Publication date:

1.9.2010.

Article data in other languages: croatian

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