Pismo uredniku
Errors arising from surface roughness in ellipsometric measurements
Kazimierz Brudzewski
; Institute of Physics, Technical University of Warsaw, Warsawa
Sažetak
A problem of importance to many investigators is the effect of surface imperfections on the measured thickness and refractive index of a thin film overlaying that surface. In this paper, errors produced by neglecting the roughness of the surface are presented.
Ključne riječi
Hrčak ID:
322516
URI
Datum izdavanja:
2.9.1974.
Posjeta: 0 *