Meeting abstract
On some problems in the screening length determination in heavily doped semiconductors
D. Tjapkin
; Faculty of Electrical Engineering, Belgrade
M. Avramov
; Institute of Physics, Novi Sad
T. Tošić
; Electronic Faculty, Niš
M. Jevtić
; Institute of Physics, Belgrade
Abstract
Four problems that arise in evaluation of the screening length are discussed. (i) According to the existing models the standard deviation begins to decrease with further increase of N. (ii) The normalizing factor in ∫ρdE = κN should be κ = 1 (for κ = 2, Eₓ ≠ Ed²). (iii) The boundary conditions for eqn. (1) should contain a correction ε, according to (14). (iv) The well-known incomplete procedure need not be solved self-consistently; a differential equation (15) may be solved instead.
Keywords
Hrčak ID:
339607
URI
Publication date:
20.12.1989.
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