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Automatika : journal for control, measurement, electronics, computing and communications, Vol. 53 No. 2, 2012.

Original scientific paper

https://doi.org/10.7305/automatika.53-2.178

A Review of Si MOS-gated Power Switches and PiN Rectifiers

José Rebollo ; Instituto de Microelectrónica de Barcelona (IMB), Centro Nacional de Microelectrónica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain
Ignasi Cortés ; Instituto de Microelectrónica de Barcelona (IMB), Centro Nacional de Microelectrónica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain
Xavier Perpiñà orcid id orcid.org/0000-0001-5946-5580 ; Instituto de Microelectrónica de Barcelona (IMB), Centro Nacional de Microelectrónica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain
José Millán ; Instituto de Microelectrónica de Barcelona (IMB), Centro Nacional de Microelectrónica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain

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Abstract

Revolutionary advances and developments have been made in power semiconductor device technologies during the last decades which have allowed the improvement of power electronic systems in terms of their efficiency and reliability. The advent of MOS-gated power switches such as the power MOSFET and the IGBT showing high input impedance has been a real breakthrough in the design and fabrication of power electronic systems. This paper reviews the recent progress in the development of Si MOS-gated power devices and rectifiers. The evolution of these devices’ technologies together with the introduction of revolutionary device concepts is also discussed. Concretely, the introduction of trench technologies for power MOSFETs and the use of the super-junction concept for breaking the 1D-silicon limit are highlighted. Developments in IGBTs such as those based on the use of thin wafers and strategies for optimising the plasma distribution in PT IGBTs during the on-state are also addressed. Finally, advances in PiN diode technologies including new concepts for both the anode and the cathode structures are also reviewed. These approaches have allowed the reduction of the PiN total losses and a soft reverse recovery behaviour, leading to a more rugged device.

Keywords

MOS-gated power devices; power MOSFETs; CoolMOS; super-junction devices; IGBTs; PiN rectifiers

Hrčak ID:

84010

URI

https://hrcak.srce.hr/84010

Publication date:

1.6.2012.

Article data in other languages: croatian

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