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Original scientific paper

Insulation Verification Using Low Voltage and High Current Sensitivity

Tonko Garma orcid id orcid.org/0000-0001-9712-1084 ; Walter Schottky Institute, Techical University of Munich
Željka Milanović ; Faculty of Engineering, University of Rijeka
Ivan Marasović ; Faculty of Electrical Engineering, Mechanical Engineering and Naval Architecture, University of Split


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Abstract

The classic approach for determining insulating resistance by using commercial testers is not reliable for testing different types of insulation, especially for cables with one conductor and nanoelectronic oxide-based devices (nanotransistors). In this paper an alternative low-voltage method for measuring insulation resistance based on strongly increased current sensitivity is proposed. The proposed method of measuring insulation resistance at low voltages is realized by using a high sensitivity Keithley SMU 2612 unit. The verification of the proposed method is made by measuring insulation resistance of medical Corkscrew Electrode and gate oxide resistance for nano-scaled MOSFET. Finally, results of measuring insulation resistance obtained by commercial testers and proposed method in the verification process are compared.

Keywords

Commercial insulation testers; Insulation resistance measuring methods; Low-voltage resistance measuring method; Nano-transistor gate-oxide resistance

Hrčak ID:

84222

URI

https://hrcak.srce.hr/84222

Publication date:

18.6.2012.

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