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A two-dimensional analysis of carriers’ transport in the MOS structures

R. M. Ramović ; Faculty of Electrical Engineering and Institute of Physics, Belgrade, Yugoslavia
D. A. Tjapkin ; Faculty of Electrical Engineering and Institute of Physics, Belgrade, Yugoslavia
J. P. Marinković ; Faculty of Electrical Engineering and Institute of Physics, Belgrade, Yugoslavia


Puni tekst: engleski pdf 13.789 Kb

str. 50-54

preuzimanja: 45

citiraj


Sažetak

Starting from the carriers’ transport equation in semiconductors, a mathematical model was proposed for the two-dimensional analysis of the potential distribution (φ) and the carriers’ concentration in the semiconductor of a MOS transistor structure. The model proposed provides a possibility of a full analysis of the influence of particular parameters on the important quantities characterizing the real structures.

Ključne riječi

Hrčak ID:

340693

URI

https://hrcak.srce.hr/340693

Datum izdavanja:

15.12.1980.

Posjeta: 162 *